Novel method for evaluation of a thin phase hologram

Bingheng Xiong; Zhengrong Wang; Yongan Zhang; Liyun Zhong; Wenbi Zhang; Qiming Yang

doi:10.1117/12.263068

31 December 1996 Novel method for evaluation of a thin phase hologram

Bingheng Xiong, Zhengrong Wang, Yongan Zhang, Liyun Zhong, Wenbi Zhang, Qiming Yang

Proceedings Volume 2866, International Conference on Holography and Optical Information Processing (ICHOIP '96); (1996) https://doi.org/10.1117/12.263068
Event: International Conference on Holography and Optical Information Processing, 1996, Nanjing, China

Abstract

To evaluate a hologram by measuring its optical density D, diffraction efficiency (tau) and signal-noise ratio SNR is a conventional method in holography. In this paper, a novel method is proposed for evaluation of a thin, phase holograms by testing phase modulation together with D, (tau) and SNR. Many properties of the thin, phase holograms are related to phase modulation, so that to control the value of phase modulation in making a thin, phase hologram is important. The value of the phase modulation of a hologram can be obtained by measuring the irradiance of its zero and first- order diffraction and calculating their ratio. This method will help holographers to obtain a perfect understanding of a thin, phase hologram and help them to choose the optimum parameters of exposure so as to obtain an expectation result. The theoretical analysis of this method are given and some applications are also introduced.

Citation Download Citation

Bingheng Xiong, Zhengrong Wang, Yongan Zhang, Liyun Zhong, Wenbi Zhang, and Qiming Yang "Novel method for evaluation of a thin phase hologram", Proc. SPIE 2866, International Conference on Holography and Optical Information Processing (ICHOIP '96), (31 December 1996); https://doi.org/10.1117/12.263068

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