Fast ellipsometry and Mueller matrix ellipsometry using the division-of-amplitude photopolarimeter

Shankar Krishnan; Paul C. Nordine

doi:10.1117/12.246205

16 August 1996 Fast ellipsometry and Mueller matrix ellipsometry using the division-of-amplitude photopolarimeter

Shankar Krishnan, Paul C. Nordine

Proceedings Volume 2873, International Symposium on Polarization Analysis and Applications to Device Technology; (1996) https://doi.org/10.1117/12.246205
Event: International Symposium on Polarization Analysis and Applications to Device Technology, 1996, Yokohama, Japan

Abstract

This paper describes the division-of-amplitude photopolarimeter, DOAP, which measures the complete polarization state of light at rates up to 2 KHz and is being developed for measurement rates up to 2 MHz. Application of the DOAP for fast ellipsometry and for Mueller-matrix ellipsometry is also described. Example results from fast ellipsometry during pulse heating experiments are given. Mueller-matrix ellipsometry using rotating quarter wave retarders and liquid crystal phase retarders is presented along with recent results.

Citation Download Citation

Shankar Krishnan and Paul C. Nordine "Fast ellipsometry and Mueller matrix ellipsometry using the division-of-amplitude photopolarimeter", Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); https://doi.org/10.1117/12.246205

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