Design of polarized light interference microscopy

Haiwu Yu; Shao-Xian Meng

doi:10.1117/12.251858

23 September 1996 Design of polarized light interference microscopy

Haiwu Yu, Shao-Xian Meng

Proceedings Volume 2885, Holographic Optical Elements and Displays; (1996) https://doi.org/10.1117/12.251858
Event: Photonics China '96, 1996, Beijing, China

Abstract

A novel equivalent optical path polarized light interference microscopy has been designed which provides two attractive properties of the perfect bright-field background techniques. This microscopy is suitable for detecting the phase objects and microdamage spots or inclusions in the transparent optical materials.

Citation Download Citation

Haiwu Yu and Shao-Xian Meng "Design of polarized light interference microscopy", Proc. SPIE 2885, Holographic Optical Elements and Displays, (23 September 1996); https://doi.org/10.1117/12.251858

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