Paper
25 September 1997 Signal processing technique for proper on-line exponential decay monitoring in the presence of nonexponential and multiexponential contributions
Andrea Kobe, Janez Ivan Mozina
Author Affiliations +
Proceedings Volume 3100, Sensors, Sensor Systems, and Sensor Data Processing; (1997) https://doi.org/10.1117/12.281258
Event: Lasers and Optics in Manufacturing III, 1997, Munich, Germany
Abstract
Low intensity, contributions of background light, reabsorption and amplification can distort the signal and prevent fast and accurate determination of the measured quantity in the fluorescent lifetime based sensors. Methods such as Prony's least-squares method or lock-in phase sensitive techniques are usually employed. They are all prone to errors, as it was shown by several authors. They can be improved, but at the expense of heavy computation. An alternative way to accurately determine decay rate from measurement is a simple digital signal processing technique presented in the article. It is based on modified digital lock-in technique, enabling on-line monitoring. Effects of DC offset, linear and exponential contributions on the proper decay rate determination are discussed in the article and effectively eliminated by the technique. Optimal process parameters are evaluated and experimental confirmation with the basic scheme given. A digital processing was implemented with software, but its simplicity enables simple digital hardware implementation.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrea Kobe and Janez Ivan Mozina "Signal processing technique for proper on-line exponential decay monitoring in the presence of nonexponential and multiexponential contributions", Proc. SPIE 3100, Sensors, Sensor Systems, and Sensor Data Processing, (25 September 1997); https://doi.org/10.1117/12.281258
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KEYWORDS
Signal processing

Luminescence

Sensors

Digital signal processing

Signal to noise ratio

Temperature metrology

Time metrology

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