Co- and cross-polarized fields scattered from irregular layered structures: full wave analysis

Ezekiel Bahar; Yuzhi Zhang

doi:10.1117/12.278965

3 October 1997 Co- and cross-polarized fields scattered from irregular layered structures: full wave analysis

Ezekiel Bahar, Yuzhi Zhang

Proceedings Volume 3121, Polarization: Measurement, Analysis, and Remote Sensing; (1997) https://doi.org/10.1117/12.278965
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

The full wave solution for scattering from 2D irregular layered structures is expressed a sum of the radiation fields, the lateral waves, and the surface waves. Only the radiation far fields are considered in this work, since excitations of plane waves are considered and the observation points are in the far field region. The like and cross polarized diffuse scattered fields are derived for three medium irregular structures with 2D rough interfaces. The thickness of the coating material or thin film between the two interfaces is assumed to be constant. Thus in this case both interfaces are rough and there are five different scattering processes identified in the full wave results. The full wave diffuse scatter solutions reduce to the perturbation solution when the surface rms heights and slopes are very small and of the same order of smallness. When the surface radii of curvature and rms heights ar very large the full wave scatter solutions reduce to the physical optics solutions. The polarimetric solutions can be applied to remote sensing of dielectric coating materials on rough surfaces.

Citation Download Citation

Ezekiel Bahar and Yuzhi Zhang "Co- and cross-polarized fields scattered from irregular layered structures: full wave analysis", Proc. SPIE 3121, Polarization: Measurement, Analysis, and Remote Sensing, (3 October 1997); https://doi.org/10.1117/12.278965

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