Comparison of three different ray trace programs for x-ray and infrared synchrotron beamline designs

Steven C. Irick; Christian Jung

doi:10.1117/12.290253

16 October 1997 Comparison of three different ray trace programs for x-ray and infrared synchrotron beamline designs

Steven C. Irick, Christian Jung

Proceedings Volume 3153, Accelerator-Based Infrared Sources and Applications; (1997) https://doi.org/10.1117/12.290253
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

There are a number of ray trace programs currently used for the design of synchrotron beamlines. While several of these programs have been written and used mostly within the programmer's institution, many have also been available to the general public. This paper discusses three such programs. One is a commercial product oriented for the general optical designer (not specifically for synchrotron beamlines). One is designed for synchrotron beamlines and is free with restricted availability. Finally, one is designed for synchrotron beamlines and is used primarily in one institution. The wealth of information from general optical materials and components catalogs is readily available in the commercial program for general optical designs. This makes the design of an infrared beamline easier from the standpoint of component selection. However, this program is not easily configured for synchrotron beamline designs, particularly for a bending magnet source. The synchrotron ray trace programs offer a variety of sources, but generally are not as easy to use from the standpoint of the user interface. This paper shows ray traces of the same beamline using Optikwerks, SHADOW, and RAY, and compares the results.

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Steven C. Irick and Christian Jung "Comparison of three different ray trace programs for x-ray and infrared synchrotron beamline designs", Proc. SPIE 3153, Accelerator-Based Infrared Sources and Applications, (16 October 1997); https://doi.org/10.1117/12.290253

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KEYWORDS

Synchrotrons

Infrared radiation

Ray tracing

Mirrors

X-rays

Optical design

Thermal modeling

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