Rule-based inspection of printed green ceramic tape

David R. Patek; James S. Goddard Jr.; Thomas P. Karnowski; Douglas Lamond; Terry A. Hawkins

doi:10.1117/12.301234

2 February 1998 Rule-based inspection of printed green ceramic tape

David R. Patek, James S. Goddard Jr., Thomas P. Karnowski, Douglas Lamond, Terry A. Hawkins

Proceedings Volume 3306, Machine Vision Applications in Industrial Inspection VI; (1998) https://doi.org/10.1117/12.301234
Event: Photonics West '98 Electronic Imaging, 1998, San Jose, CA, United States

Abstract

A template-based vision system for the 100% inspection of printed flaws on green ceramic tape has been developed. Design goals included a requirement for the detection of flaws as small as two thousandths of an inch on parts up to 8 by 8 inches in size. The inspection engine is a Datacube, Inc., MV200 pipeline processor. As each part is inspected, four 2K by 2K pixel quadrant images are stitched together to construct a single 4K by 4K pixel image with the aid of multiple fiducials located in each quadrant. The part fiducial locations, mask image, and punched-hole position data are generated, beforehand, from CAD designs using a defect map editor (DME), a preprocessing software packaged developed for the PC. The DME also generates a part `defect map'. Each unique structure in the printed pattern is defined as an object. Objects are grouped into user-defined categories such as die pads, contact fingers, traces, and electrolysis buses. The map is used during the runtime inspection to associate each detected defect with an object group and a particular defect specification for that group. Repeat defects are optionally tracked for up to three consecutive parts.

Citation Download Citation

David R. Patek, James S. Goddard Jr., Thomas P. Karnowski, Douglas Lamond, and Terry A. Hawkins "Rule-based inspection of printed green ceramic tape", Proc. SPIE 3306, Machine Vision Applications in Industrial Inspection VI, (2 February 1998); https://doi.org/10.1117/12.301234

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available