Paper
1 February 1998 Explanation of some experimental phenomena in MIM-LCD by using a P.-N-N+ band model
Hui W. Liu, Yuan Wu, Shuqing Fu, Kai Ma, Xinmin Huang
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Abstract
The image-sticking caused by the asymmetry and shift of current-voltage (I-V) characteristics of the MIM element is a big problem in MIM-LCD. The I-V characteristics couldn't be described accurately and comprehensively by conventional Poole-Frenkel equation, so it is difficult to estimate and optimize various parameters to solve the problems, which means the optimization of the parameters requires many experiments with much effort. In this article, considering the effect of the two interface layers which exist between the two electrodes and the intermediate layer, we introduce a p-n-n+ band model. Using this model, we can explain the reason of the asymmetry and why it is easier to produce Poole-Frenkel effect from the top-electrode to the bottom- electrode than it does on the opposite direction. Meanwhile, we propose that using the weaker electronegative metal as top-electrode or using the sputtered tantalum oxide instead of the anodized tantalum oxides as insulator layer can solve the problem.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hui W. Liu, Yuan Wu, Shuqing Fu, Kai Ma, and Xinmin Huang "Explanation of some experimental phenomena in MIM-LCD by using a P.-N-N+ band model", Proc. SPIE 3318, Liquid Crystals: Physics, Technology, and Applications, (1 February 1998); https://doi.org/10.1117/12.299961
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KEYWORDS
Tantalum

Electrodes

Chemical elements

Oxides

Chromium

LCDs

Metals

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