Paper
26 October 1998 Monolithic two-color detector for short- and middle-wavelength IR using p-HgCdTe/N-HgCdTe/CdTe/GaAs
Seung-Man Park, Jae Mook Kim, Jong-Hyeong Song, Sang-Hee Suh
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Abstract
A new device concept and implementation procedure of a monolithic two-color IR detector using MOVPE grown p-HgCdTe/N- HgCdTe/CdTe/GaAs is discussed. Newly introduced two-color IR detector consists of simple n-p-N structure, which can be realized using simple p-N double layer HgCdTe material. Formation of potential barrier in the conduction band of p-N heterojunction is a key to the successful operation of monolithic two-color IR detector. It prevents photogenerated minority carriers in small band gap region (p-HgCdTe) from diffusing to N-HgCdTe. The monolithic two-color IR detector was firstly fabricated using MOVPE grown p-Hg0.69Cd0.31Te/N-Hg0.64Cd0.36Te/CdTe/GaAs for SW/MWIR. SWIR diode shows RoA value of 752 (Omega) cm2, while MWIR diode shows RoA value of 140 (Omega) cm2.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Seung-Man Park, Jae Mook Kim, Jong-Hyeong Song, and Sang-Hee Suh "Monolithic two-color detector for short- and middle-wavelength IR using p-HgCdTe/N-HgCdTe/CdTe/GaAs", Proc. SPIE 3436, Infrared Technology and Applications XXIV, (26 October 1998); https://doi.org/10.1117/12.327989
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KEYWORDS
Diodes

Infrared detectors

Mercury cadmium telluride

Sensors

Medium wave

Mid-IR

Short wave infrared radiation

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