Paper
21 September 1998 Polarization considerations
Author Affiliations +
Proceedings Volume 3482, International Optical Design Conference 1998; (1998) https://doi.org/10.1117/12.321998
Event: International Optical Design Conference, 1998, Kona, HI, United States
Abstract
No abstract available.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eugene Waluschka "Polarization considerations", Proc. SPIE 3482, International Optical Design Conference 1998, (21 September 1998); https://doi.org/10.1117/12.321998
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Polarization

Ray tracing

Thin films

Coating

Lens design

Reflectivity

Optical design

RELATED CONTENT

Optimality of thin film optical coating design
Proceedings of SPIE (August 01 1990)
Polarization aberration in resource satellite system
Proceedings of SPIE (February 10 2005)
Integration Of Thin-Film Coatings Into Optical Systems
Proceedings of SPIE (September 16 1980)
VIIRS polarization sensitivity testing and analysis
Proceedings of SPIE (August 11 2009)

Back to Top