Paper
21 October 1998 Dispersion of the real and imaginary parts of cubic susceptibility in submicron films of pseudoisocyanine J aggregates
Alexander I. Plekhanov, Sergei G. Rautian, Vladimir P. Safonov, Pavel A. Chubakov, Natalja A. Orlova, Vladimir V. Shelkovnikov
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Proceedings Volume 3485, 11th International Vavilov Conference on Nonlinear Optics; (1998) https://doi.org/10.1117/12.328262
Event: Eleventh International Vavilov Conference on Nonlinear Optics, 1997, Novosibirsk, Russian Federation
Abstract
The dispersion of cubic optical susceptibility of submicron films of pseudoisocianine J aggregates are measured by a z- scan technique. The values of Im(chi) (3), Re(chi) (3) near to J-peak were approximately 10-5 esu. The measurements have shown that the films near to J-peak have negative sign of Im(chi) (3)((omega) ), which corresponds to nonlinear bleaching of absorption. The maximum Im(chi) (3)((omega) ) is observed for (omega) approximately equals (omega) J. It is found that at low frequency side of J-peak the sign of Im(chi) (3)((omega) ) changes on positive. The measured dependence Re(chi) (3)((omega) ) has compared with the value calculated by Kramers-Kronig transformation. For optical dense samples the contribution of a thermal nonlinearity is displayed. The spectral behavior features of Re(chi) (3)((omega) ) and Im(chi) (3)((omega) ) are explained by four-level model of Frenkel exciton.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexander I. Plekhanov, Sergei G. Rautian, Vladimir P. Safonov, Pavel A. Chubakov, Natalja A. Orlova, and Vladimir V. Shelkovnikov "Dispersion of the real and imaginary parts of cubic susceptibility in submicron films of pseudoisocyanine J aggregates", Proc. SPIE 3485, 11th International Vavilov Conference on Nonlinear Optics, (21 October 1998); https://doi.org/10.1117/12.328262
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KEYWORDS
Absorption

Photonic integrated circuits

Excitons

Information operations

Refraction

Nonlinear optics

Data modeling

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