Semiconductor laser linewidth measurements for space interferometry applications

David J. Dougherty; Roman C. Gutierrez; Serge Dubovitsky; Siamak Forouhar

doi:10.1117/12.345421

14 April 1999 Semiconductor laser linewidth measurements for space interferometry applications

David J. Dougherty, Roman C. Gutierrez, Serge Dubovitsky, Siamak Forouhar

Proceedings Volume 3626, Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV; (1999) https://doi.org/10.1117/12.345421
Event: Optoelectronics '99 - Integrated Optoelectronic Devices, 1999, San Jose, CA, United States

Abstract

Narrow linewidth (< 100 KHz) semiconductor lasers are expected to be a key technology in NASA's stellar interferometry missions to search for planets around nearby stars. Long coherence length lasers are needed for precise (20 pm to 5 nm) measurements of the optical path difference. This work discusses results using the self-heterodyne delay technique to measure 1.3 um InP based DFB lasers. We will also address practical issues concerning detection and elimination of back reflections, choice of fiber length and resolution, and measurement of laser l/f and current supply noise.

Citation Download Citation

David J. Dougherty, Roman C. Gutierrez, Serge Dubovitsky, and Siamak Forouhar "Semiconductor laser linewidth measurements for space interferometry applications", Proc. SPIE 3626, Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV, (14 April 1999); https://doi.org/10.1117/12.345421

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