Vibration analysis using fast speckle metrology

Jon N. Petzing

doi:10.1117/12.357770

17 August 1999 Vibration analysis using fast speckle metrology

Jon N. Petzing

Proceedings Volume 3745, Interferometry '99: Applications; (1999) https://doi.org/10.1117/12.357770
Event: International Conference on Optical Metrology, 1999, Pultusk Castle, Poland

Abstract

This paper explores the use of a small frequency agile diode pumped pulsed laser source for Electronic Speckle Pattern Interferometry (ESPI) and Electronic Speckle Pattern Shearing Interferometry (ESPSI). The laser allows direct synchronization to the vibrating object being studied, thereby considerably reducing synchronization issues which have been prevalent in flash lamp pumped laser ESPI and ESPSI systems. The resonant characteristics of a square clamped plate have been examined using pulsed ESPI and ESPSI in order to validate the optical designs, with representative whole field plots of vibration amplitude being presented.

Citation Download Citation

Jon N. Petzing "Vibration analysis using fast speckle metrology", Proc. SPIE 3745, Interferometry '99: Applications, (17 August 1999); https://doi.org/10.1117/12.357770

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