Satellite contamination and materials outgassing effects databases

Bob E. Wood; B. David Green; O. Manuel Uy; Russell Paul Cain; Jason Thorpe

doi:10.1117/12.366696

25 October 1999 Satellite contamination and materials outgassing effects databases

Bob E. Wood, B. David Green, O. Manuel Uy, Russell Paul Cain, Jason Thorpe

Proceedings Volume 3784, Rough Surface Scattering and Contamination; (1999) https://doi.org/10.1117/12.366696
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

This paper describes a program for consolidating data from quartz crystal microbalances (QCMs) that will enable one to rapidly locate previous measurements on specific materials and data from past space flight experiments. When complete, the databases will contain information on materials outgassing obtained using the ASTM-E-1559 standard, and flight observations of mass accumulations. Once established, these databases will be available to the entire community and will provide a valuable source of material outgassing information. The data should be useful to those working in the Contamination area for mission design and materials specification. Data are being accumulated from both national and international sources. The space flight database will include data from past NASA missions, as well as DOD [including the BMDO-sponsored Mid-course Space Experiment (MSX) program], Canadian Space Agency, European Space Agency, Russian MIR space station, and eventually, the International Space Station. A website is being generated which will be the vehicle for storing the data that are accumulated. Once completed, the databases will be managed by the NASA/Space and Environmental Effects (SEE) Program Office at the Marshall Space Flight Center in Huntsville, Alabama.

Citation Download Citation

Bob E. Wood, B. David Green, O. Manuel Uy, Russell Paul Cain, and Jason Thorpe "Satellite contamination and materials outgassing effects databases", Proc. SPIE 3784, Rough Surface Scattering and Contamination, (25 October 1999); https://doi.org/10.1117/12.366696

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