Paper
26 October 1999 Wavelet processing of interferometric signals and fringe patterns
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Abstract
The measurement of shape, displacement and deformations is often performed using interferometric methods, featuring nm to mm sensitivities and very high spatial and temporal resolutions. We first give a brief overview of interferometric techniques. Emphasis is laid on the wide purposes of these techniques. Then, we present a novel method using wavelet analysis to process live interference patterns. Further developments of the method are then presented. Finally, through two practical examples, we intend to highlight the interest of fringe processing by wavelet transform.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michel Cherbuliez, Pierre M. Jacquot, and Xavier Colonna de Lega "Wavelet processing of interferometric signals and fringe patterns", Proc. SPIE 3813, Wavelet Applications in Signal and Image Processing VII, (26 October 1999); https://doi.org/10.1117/12.366825
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CITATIONS
Cited by 36 scholarly publications.
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KEYWORDS
Wavelets

Interferometry

Signal processing

Speckle

Wavelet transforms

Phase shift keying

Fringe analysis

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