Optical inspection of large-scale technical components

Werner P. O. Jueptner; Wolfgang Osten; Michael K. Kalms

doi:10.1117/12.364259

21 September 1999 Optical inspection of large-scale technical components

Werner P. O. Jueptner, Wolfgang Osten, Michael K. Kalms

Proceedings Volume 3824, Optical Measurement Systems for Industrial Inspection; (1999) https://doi.org/10.1117/12.364259
Event: Industrial Lasers and Inspection (EUROPTO Series), 1999, Munich, Germany

Abstract

Optical inspection is a well-known tool for scientific research and production control since long-time. In its form as visual inspection it is one of the main inspection tools since the beginning of technology. But the amount of data to be processed is very high in common, real time application under changing conditions is usually an industrial requirement, and last not least the recognition ability of human beings is hard to be matched. However, there is a dramatic change in the last one or two decades: the laser was developed to a reliable, easy to use and economical light source. Furthermore, the fast development in computer technology in the last decade opened applications for the improvement of products and production far beyond the possibilities of the first three quarters of this century. The methods can be described in a spanning tree of increasing specialization from the way of evaluation to the application task to be performed with this metrology method. However, all inspection methods follow a fundamental set-up scheme consisting of a loading, the object to be interacted with, the detector system and the evaluation. The approach to practical application will be reported by some example of large components.

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Werner P. O. Jueptner, Wolfgang Osten, and Michael K. Kalms "Optical inspection of large-scale technical components", Proc. SPIE 3824, Optical Measurement Systems for Industrial Inspection, (21 September 1999); https://doi.org/10.1117/12.364259

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KEYWORDS

Optical inspection

Nondestructive evaluation

Inspection

Holographic interferometry

Sensors

Shearography

Holography

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