Reverse engineering for rapid product development: a state of the art

Alain Bernard

doi:10.1117/12.370268

16 November 1999 Reverse engineering for rapid product development: a state of the art

Alain Bernard

Proceedings Volume 3835, Three-Dimensional Imaging, Optical Metrology, and Inspection V; (1999) https://doi.org/10.1117/12.370268
Event: Photonics East '99, 1999, Boston, MA, United States

Abstract

This paper presents a state of the art of reverse engineering for rapid product development. This domain concerns both 3D measurement for comparison between the CAD reference model and the discrete data (point clouds, CT contours), and data acquisition for CAD modeling (surface and volume modeling from grids of set of points or contours). This paper presents the main aspects of reverse engineering domain, from the sensors used for data acquisition to software for data computation and to software for part modeling from point clouds.

Citation Download Citation

Alain Bernard "Reverse engineering for rapid product development: a state of the art", Proc. SPIE 3835, Three-Dimensional Imaging, Optical Metrology, and Inspection V, (16 November 1999); https://doi.org/10.1117/12.370268

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available