FT-NIR spectroscopy for process control: recent case studies

Stephen T. DeJesus; Basil A. Desousa; Sameer Londhe; Qian Wang

doi:10.1117/12.372941

9 December 1999 FT-NIR spectroscopy for process control: recent case studies

Stephen T. DeJesus, Basil A. Desousa, Sameer Londhe, Qian Wang

Proceedings Volume 3859, Optical Online Industrial Process Monitoring; (1999) https://doi.org/10.1117/12.372941
Event: Photonics East '99, 1999, Boston, MA, United States

Abstract

Near-IR spectroscopy is the analysis of the light absorption and transmission characteristics of materials in the wavelength region extending from approximately 800 nm to 2500 nm, lying between the conventional mid-IR region at longer wavelengths and the visible region at shorter wavelengths.

Citation Download Citation

Stephen T. DeJesus, Basil A. Desousa, Sameer Londhe, and Qian Wang "FT-NIR spectroscopy for process control: recent case studies", Proc. SPIE 3859, Optical Online Industrial Process Monitoring, (9 December 1999); https://doi.org/10.1117/12.372941

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