Characteristics of super-RENS disks with various thickness of thermal protective layers

Akira Sato; Junji Tominaga; Takashi Nakano; Hiroshi Fuji; Nobufumi Atoda

doi:10.1117/12.997591

28 June 1999 Characteristics of super-RENS disks with various thickness of thermal protective layers

Akira Sato, Junji Tominaga, Takashi Nakano, Hiroshi Fuji, Nobufumi Atoda

Proceedings Volume 3864, Joint International Symposium on Optical Memory and Optical Data Storage 1999; 38641E (1999) https://doi.org/10.1117/12.997591
Event: Optical Data Storage, 1999, Kauai, HI, United States

Abstract

Recently a super-resolution near-field structure (Super-RENS) has been proposed. A storage density of a conventional optical disk has been limited by the diffraction limit of the light. During the readout process of a Super-RENS, a small aperture is formed in a masklayer by a readout laser power. The mask layer is laid very close to a recording layer, and the aperture produced in the mask layer acts as an optical near-field probe. We have retrieved marks as small as 60 nm.

Citation Download Citation

Akira Sato, Junji Tominaga, Takashi Nakano, Hiroshi Fuji, and Nobufumi Atoda "Characteristics of super-RENS disks with various thickness of thermal protective layers", Proc. SPIE 3864, Joint International Symposium on Optical Memory and Optical Data Storage 1999, 38641E (28 June 1999); https://doi.org/10.1117/12.997591

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