Metrology for optoelectronics

Gordon W. Day

doi:10.1117/12.370326

12 November 1999 Metrology for optoelectronics

Gordon W. Day

Proceedings Volume 3896, Design, Fabrication, and Characterization of Photonic Devices; (1999) https://doi.org/10.1117/12.370326
Event: International Symposium on Photonics and Applications, 1999, Singapore, Singapore

Abstract

This paper discusses measurement technology, standards, and traceability for the optoelectronics industry. Examples include the development of artifact standards, known as standard reference materials, for the calibration of instrumentation, and the calibration of laser and optical fiber power meters and detectors.

Citation Download Citation

Gordon W. Day "Metrology for optoelectronics", Proc. SPIE 3896, Design, Fabrication, and Characterization of Photonic Devices, (12 November 1999); https://doi.org/10.1117/12.370326

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