Paper
14 June 2000 Image analysis of high-cycle fatigue strains of SMAs
Young Sook Roh, Yunping Xi, Jeffrey L. Summers
Author Affiliations +
Abstract
There have been very few research results available for high cycle fatigue properties of SMAs. In many of the devices designed to exploit the effect of fatigue loadings, the specimen is subjected to only several thousand thermal or loading cycles. Therefore, the stability of the alloy under applied loading with high cycle fatigue becomes an important issue. Moreover, there has not been any fatigue testing in compression for SMAs. The behavior of SMAs under tension and compression may be different, which is very important for many special applications of SMAs. The behavior of SMAs under tension and compression may be different, which is very important for many special applications of SMAs. The present study focus on the high cycle fatigue to SMAs under compression. A new surface monitoring technique for micro- deformation and micro-strain analysis, called IIMT, is introduced. IIMT is used for monitoring the performance of SMAs under high cycle stress loading in compression. The stress-strain curves and shape memory strain output at various loading cycles were obtained, which provide valuable information for design and applications of SMAs.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Young Sook Roh, Yunping Xi, and Jeffrey L. Summers "Image analysis of high-cycle fatigue strains of SMAs", Proc. SPIE 3992, Smart Structures and Materials 2000: Active Materials: Behavior and Mechanics, (14 June 2000); https://doi.org/10.1117/12.388226
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Shape memory alloys

Image processing

Image analysis

Digital imaging

Scanning electron microscopy

Computing systems

Digital image processing

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