Near-field millimeter-wave injection and its application in probing of high-frequency devices

Harold R. Fetterman; Mohammed Ershad Ali; Kandadai S. Ramesh; Talal Azfar; Dwight C. Streit; Seok K. Han; Kwang Y. Kang

doi:10.1117/12.422131

18 December 2000 Near-field millimeter-wave injection and its application in probing of high-frequency devices

Harold R. Fetterman, Mohammed Ershad Ali, Kandadai S. Ramesh, Talal Azfar, Dwight C. Streit, Seok K. Han, Kwang Y. Kang

Proceedings Volume 4111, Terahertz and Gigahertz Electronics and Photonics II; (2000) https://doi.org/10.1117/12.422131
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

A novel technique, that combines optical heterodyning and near-field optics, was developed for highly localized of millimeter waves in ultrafast devices. The technique relies on evanescent coupling of the interfering laser to a small are of the device, by means of a near-field fiber optic probe. The applicability of the technique was first validated by measurements on heterojunction photo transistors up to 100GHz. Later, scanned measurements at 63GHz were performed on two ultrafast device structures, namely low temperature GaAs photoconductive switches and InP-based high electron mobility transistors. The response characteristics were rich in structures that revealed important details of the device dynamics.

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Harold R. Fetterman, Mohammed Ershad Ali, Kandadai S. Ramesh, Talal Azfar, Dwight C. Streit, Seok K. Han, and Kwang Y. Kang "Near-field millimeter-wave injection and its application in probing of high-frequency devices", Proc. SPIE 4111, Terahertz and Gigahertz Electronics and Photonics II, (18 December 2000); https://doi.org/10.1117/12.422131

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