Principles of design of an optical/digital system for the high-temperature melt interfacial tension measurement

Yaroslav P. Kulynych; Taras I. Voronyak; Olexander P. Maksymenko

doi:10.1117/12.388455

14 June 2000 Principles of design of an optical/digital system for the high-temperature melt interfacial tension measurement

Yaroslav P. Kulynych, Taras I. Voronyak, Olexander P. Maksymenko

Author Affiliations +

Proceedings Volume 4148, Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing; (2000) https://doi.org/10.1117/12.388455
Event: International Workshop on Optoelectronic and Hybrid Optical/Digital Systems for Image/Signal Processing, 1999, Lviv, Ukraine

Abstract

The optical-digital systems find more and more broad application in scientific researches and productions. In particular the researches of the capillary characteristics of materials with the purpose of development of effective solders to design compounds metal-ceramics execute on special techniques in the high-temperature (700 - 1100 degree(s)C) vacuum installations (3 (DOT) 10^-3 P). The specifity of such researchers requires the use of remote methods for determination of the characteristics of materials (factor of surface tension and angle of wetting). The indicated characteristics of materials are determined through geometric images of drops of melts registered and processed by optical-electron and optical-digital systems. The modern optical-digital systems for registration and image processings are created on the basis of photoreceivers or devices with charging connection (CCD-lines, CCD-matrices and CCD-video cameras) and personal computer. Use and development of such digital systems has raised the question on choosing of optical system elements with the goal of optimization of their parameters and increase of accuracy of determination of the objects geometric sizes.

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Yaroslav P. Kulynych, Taras I. Voronyak, and Olexander P. Maksymenko "Principles of design of an optical/digital system for the high-temperature melt interfacial tension measurement", Proc. SPIE 4148, Optoelectronic and Hybrid Optical/Digital Systems for Image and Signal Processing, (14 June 2000); https://doi.org/10.1117/12.388455

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