Paper
12 February 2001 Topography reconstruction of specular surfaces from a series of gray-scale images
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Abstract
During the design and manufacturing processes of specular surfaces, waviness and shape defects may occur, reducing the quality of the surface regarding its visual appearance and/or its technical performance. Typically, these defects are only a few micrometers deep and a few centimeters wide. Beside the plain defect recognition, the reconstruction of the surface topography is of great interest, because it allows to characterize defects quantitatively. To reconstruct specular surfaces, a reflection technique based on structured-lighting is used. The specular object is considered as a part of the optical system. This technique is sensitive to changes of the slope of the surface. A series of patterns produced by an illumination system and reflected at the specular surface is observed by a camera. The distortions of the patterns in the acquired images contain information on the shape of the surface. This information is recovered through a model of the imaging function of the optical system. In contrast to previous approaches, with the proposed method it is possible to reconstruct the topography of the specular surface without an iterative approximation. This is achieved by applying a smoothness constraint to the surface data and directly calculating the surface topography from the imaging function.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Soeren Kammel "Topography reconstruction of specular surfaces from a series of gray-scale images", Proc. SPIE 4189, Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology, (12 February 2001); https://doi.org/10.1117/12.417188
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Cited by 5 scholarly publications.
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KEYWORDS
Cameras

Reflection

Sensors

Data modeling

Ray tracing

Imaging systems

CCD image sensors

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