New application of holography and interferometry in temperature sensing

Jing Zhou; Henry F. Taylor

doi:10.1117/12.402577

9 October 2000 New application of holography and interferometry in temperature sensing

Jing Zhou, Henry F. Taylor

Proceedings Volume 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications; (2000) https://doi.org/10.1117/12.402577
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China

Abstract

A new application of holography and interferometry in temperature sensing is proposed in this paper. Using holographic technique and electron lithography, a grating can be made in a fiber's end. This structure can be used to test the temperature change. By examining the interfering pattern of diffract lights of the grating, the temperature change can be calculated. If using the work wavelength of 1.55micrometers , the temperature testing range can theoretically be 1179 degree(s)C.

Citation Download Citation

Jing Zhou and Henry F. Taylor "New application of holography and interferometry in temperature sensing", Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); https://doi.org/10.1117/12.402577

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