Feature matching and improved Hough transform in visible measurement

Bangxin Shen; Yincai Yang; Lingfeng Chen; Lu Shen; Yong Dai

doi:10.1117/12.403904

10 October 2000 Feature matching and improved Hough transform in visible measurement

Bangxin Shen, Yincai Yang, Lingfeng Chen, Lu Shen, Yong Dai

Proceedings Volume 4222, Process Control and Inspection for Industry; (2000) https://doi.org/10.1117/12.403904
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China

Abstract

This paper presents a new idea of Epipolar Slope. There are some feature points, e.g. the inflection point, on the epipolar line or curve. The homonymous points can be discovered in a couple images, and Feature Matching can be achieved as visible measurement. The Improved Hough Transform has been discussed in this paper because the standard quadratic curve may be discovered by the Improved Hough Transform as the pre-process of the Feature Matching.

Citation Download Citation

Bangxin Shen, Yincai Yang, Lingfeng Chen, Lu Shen, and Yong Dai "Feature matching and improved Hough transform in visible measurement", Proc. SPIE 4222, Process Control and Inspection for Industry, (10 October 2000); https://doi.org/10.1117/12.403904

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