Paper
6 October 2000 New standardized method for an optical sensor of a particle counter
Author Affiliations +
Proceedings Volume 4231, Advanced Optical Manufacturing and Testing Technology 2000; (2000) https://doi.org/10.1117/12.402836
Event: International Topical Symposium on Advanced Optical Manufacturing and Testing Technology, 2000, Chengdu, China
Abstract
There are a few difference in the characters of the optical sensors of the particle's counter when it is been making because of the technical difference between the sensors. So, the criterion must been used for the sensors. In the traditional method, only one or two kinds of the standard particles is used as criterion because that the continual function of distribution of the particles can not be gotten from an old data processing method. That is to say there is not reflected absolutely for the characters of the sensor itself because of the non-linearity and continuity of the distribution. And than, the effecting of the criterion of the counter is weakening greatly. In this paper, a new infinite channels concept and a probability function are put forward, through which, the continual distribution function of the particles can be gotten by using the technology of the A/D conversion, coding channels, data address and sum. Three kinds of the distribution function of the standard particles are used as criterion, the criterion can be completed through the comparing the standard function and real-measuring function. At last, the debugging is very simple in the Electro-circuit instead of the optics and the effect of it is enhanced greatly.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yawei Wang, Anzhi He, and Baomin Bian "New standardized method for an optical sensor of a particle counter", Proc. SPIE 4231, Advanced Optical Manufacturing and Testing Technology 2000, (6 October 2000); https://doi.org/10.1117/12.402836
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KEYWORDS
Particles

Sensors

Data conversion

Optical sensors

Standards development

Scattering

Data processing

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