Development and characterization of an integrated multispectral polarimetric sensor: a discrete approach

Dong-Hyun C. Kim; Cardinal Warde; Kenneth Vaccaro; Charles L. Woods; Alvin J. Drehman

doi:10.1117/12.426963

15 May 2001 Development and characterization of an integrated multispectral polarimetric sensor: a discrete approach

Dong-Hyun C. Kim, Cardinal Warde, Kenneth Vaccaro, Charles L. Woods, Alvin J. Drehman

Proceedings Volume 4306, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II; (2001) https://doi.org/10.1117/12.426963
Event: Photonics West 2001 - Electronic Imaging, 2001, San Jose, CA, United States

Abstract

We introduce a new type of integrated imaging sensor that detects multispectral and polarimetric signatures in an IR scene. The sensor is a stack consisting of an IR detector array, and an array of multispectral and polarimetric filters. In this first phase of the research, we fabricated multispectral filters for the 3-5 micron waveband don sapphire substrates and polarimetric filters on silicon substrates. These were characterized separately and in mechanical contact as a single unit. The transmission characteristics of both filters show excellent agreement with the theoretical result. Whenthe filters are integrated into an imaging sensor, such a sensor is anticipated to improve image contrast with sensor-fusion post processing. In addition, it will offer portability and robustness because of its integrated nature.

Citation Download Citation

Dong-Hyun C. Kim, Cardinal Warde, Kenneth Vaccaro, Charles L. Woods, and Alvin J. Drehman "Development and characterization of an integrated multispectral polarimetric sensor: a discrete approach", Proc. SPIE 4306, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II, (15 May 2001); https://doi.org/10.1117/12.426963

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