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In this contribution we present the results of many-body calculation on electron photodetachment from inner subshells of Sn- negative ion. The main attention is paid to qualitative changes in the near threshold 4d cross section induced by rearrangement effects.
Vadim K. Ivanov,Galina Yu. Kashenock, andConstantin V. Lapkin
"Rearrangement effects in inner-shell photodetachment from Sn-negative ion", Proc. SPIE 4348, Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (1 February 2001); https://doi.org/10.1117/12.417628
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Vadim K. Ivanov, Galina Yu. Kashenock, Constantin V. Lapkin, "Rearrangement effects in inner-shell photodetachment from Sn-negative ion," Proc. SPIE 4348, Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (1 February 2001); https://doi.org/10.1117/12.417628