Rearrangement effects in inner-shell photodetachment from Sn-negative ion

Vadim K. Ivanov; Galina Yu. Kashenock; Constantin V. Lapkin

doi:10.1117/12.417628

1 February 2001 Rearrangement effects in inner-shell photodetachment from Sn^-negative ion

Vadim K. Ivanov, Galina Yu. Kashenock, Constantin V. Lapkin

Proceedings Volume 4348, Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering; (2001) https://doi.org/10.1117/12.417628
Event: Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, 2000, St. Petersburg, Russian Federation

Abstract

In this contribution we present the results of many-body calculation on electron photodetachment from inner subshells of Sn^- negative ion. The main attention is paid to qualitative changes in the near threshold 4d cross section induced by rearrangement effects.

Citation Download Citation

Vadim K. Ivanov, Galina Yu. Kashenock, and Constantin V. Lapkin "Rearrangement effects in inner-shell photodetachment from Sn^-negative ion", Proc. SPIE 4348, Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (1 February 2001); https://doi.org/10.1117/12.417628

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available