Failure mode analysis of high-power laser diodes

Robert G. Ahrens; James J. Jaques; Niloy K. Dutta; Michael J. LuValle; Alfonso B. Piccirilli; Ron M. Camarda; Anthony B. Fields; Kenneth R. Lawrence

doi:10.1117/12.462657

16 April 2002 Failure mode analysis of high-power laser diodes

Robert G. Ahrens, James J. Jaques, Niloy K. Dutta, Michael J. LuValle, Alfonso B. Piccirilli, Ron M. Camarda, Anthony B. Fields, Kenneth R. Lawrence

Author Affiliations +

Proceedings Volume 4648, Test and Measurement Applications of Optoelectronic Devices; (2002) https://doi.org/10.1117/12.462657
Event: Symposium on Integrated Optoelectronic Devices, 2002, San Jose, California, United States

Abstract

In this paper, we present the results of a preliminary investigation on the reliability of high power optical diodes. Commercially available 970 nm optical diodes were subjected to various levels of stress, including: operating current, optical power and operating temperature. Optical diodes that failed during testing were subsequently analyzed using a variety of techniques, including: optical microscopy, scanning electron microscopy, eletroluminescence, and near-field profiling. It has been observed that the major cause of optical failure can be attributed to damage on the emitting facet of the optical diodes. Preliminary evidence suggests that facet damage is a result of catastrophic optical damage.

Citation Download Citation

Robert G. Ahrens, James J. Jaques, Niloy K. Dutta, Michael J. LuValle, Alfonso B. Piccirilli, Ron M. Camarda, Anthony B. Fields, and Kenneth R. Lawrence "Failure mode analysis of high-power laser diodes", Proc. SPIE 4648, Test and Measurement Applications of Optoelectronic Devices, (16 April 2002); https://doi.org/10.1117/12.462657

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