Shack-Hartmann wavefront sensor precision and accuracy

Daniel R. Neal; James Copland; David A. Neal

doi:10.1117/12.450850

11 November 2002 Shack-Hartmann wavefront sensor precision and accuracy

Daniel R. Neal, James Copland, David A. Neal

Proceedings Volume 4779, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components; (2002) https://doi.org/10.1117/12.450850
Event: International Symposium on Optical Science and Technology, 2002, Seattle, WA, United States

Abstract

The design of a wavefront sensor may be determined by the lenslet array and camera selection. There are numerous different applications for these sensors, requiring widely differing dynamic range and accuracy. Performance metrics are needed to evaluate candidate designs and to compare results. We have developed a standard methodology for measuring the repeatability, accuracy and dynamic range of different wavefront sensor designs, and have experimentally applied these metrics to a number of different sensors.

Citation Download Citation

Daniel R. Neal, James Copland, and David A. Neal "Shack-Hartmann wavefront sensor precision and accuracy", Proc. SPIE 4779, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components, (11 November 2002); https://doi.org/10.1117/12.450850

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