Paper
24 December 2002 Temperature-dependence perturbations on LTP measurements
Author Affiliations +
Abstract
The Long Trace Profiler (LTP) has proved to be one of the major metrological aids for the characterization of synchrotron radiation optics. Currently the optical components installed at the beamlines face higher and higher demands, requiring a precise calibration and control of the measuring conditions. One important parameter to be considered while scanning is the temperature drifts afflicting the measuring sessions. We will review our experiences about the influence of this parameter on the LTP ability in measuring very accurate optical surfaces. It is possible to discriminate at least four major sources of perturbations due to temperature changes: air turbulence, deformation in the optical train inside the LTP optics head, deformation of the optical surface under test (SUT) and deformation of the holders of the SUT itself. Some addresses on the curing of these perturbations can be obtained.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Giovanni Sostero, Anna Bianco, Marco Zangrando, and Daniele Cocco "Temperature-dependence perturbations on LTP measurements", Proc. SPIE 4782, X-Ray Mirrors, Crystals, and Multilayers II, (24 December 2002); https://doi.org/10.1117/12.450981
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Mirrors

Head

Phase modulation

Temperature metrology

Metrology

Thermography

Control systems

Back to Top