Vibration analysis of layered structures by optoelectronics methods

Giuseppe Schirripa Spagnolo; Massimo Pappalardo; Antonio Iula; Riccardo Carotenuto; Raffaele Majo; Dario Ambrosini; Domenica Paoletti

doi:10.1117/12.468151

22 May 2002 Vibration analysis of layered structures by optoelectronics methods

Giuseppe Schirripa Spagnolo, Massimo Pappalardo, Antonio Iula, Riccardo Carotenuto, Raffaele Majo, Dario Ambrosini, Domenica Paoletti

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Proceedings Volume 4827, Fifth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications; (2002) https://doi.org/10.1117/12.468151
Event: Fifth International Conference on Vibration Measurements by Laser Techniques, 2002, Ancona, Italy

Abstract

Today, the vibration analysis of laminated structures represents an important field in engineering metrology. To perform non-invasive vibration measurements in industrial environments, optical methods are a preferable choice. Electronic Speckle Pattern Interferometry is a method, which permits full field and non-contacting displacement or deformation measurements. The experimental measurement of the resonant frequencies for the piezoceramic material is generally performed by impedance analysis. In this work, Electronic Speckle Pattern Interferometry (ESPI) technique is proposed for studying vibration of piezoceramic/nickel circular laminated plates. The circular membrane is a composite made of a nickel alloy disk with thickness 0. 1 mm and diameter 32 mm, to which a piezoceramic disk, with the same thickness and a smaller diameter (24 mm) is bonded. The time average frame subtraction technique is improved by subtracting two Bessel fringe patterns at two different amplitude levels. A brief analysis of the techniques and some preliminary experimental tests are presented.

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Giuseppe Schirripa Spagnolo, Massimo Pappalardo, Antonio Iula, Riccardo Carotenuto, Raffaele Majo, Dario Ambrosini, and Domenica Paoletti "Vibration analysis of layered structures by optoelectronics methods", Proc. SPIE 4827, Fifth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, (22 May 2002); https://doi.org/10.1117/12.468151

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KEYWORDS

Vibrometry

Charge-coupled devices

Speckle pattern

Fringe analysis

Interferometry

CCD cameras

Optoelectronics

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