Hidden grids, moiré patterns, and 3D metrology

Pablo F. Meilan; Anibal P. Laquidara; Mario Garavaglia

doi:10.1117/12.524147

19 November 2003 Hidden grids, moire patterns, and 3D metrology

Pablo F. Meilan, Anibal P. Laquidara, Mario Garavaglia

Proceedings Volume 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life; (2003) https://doi.org/10.1117/12.524147
Event: 19th Congress of the International Commission for Optics: Optics for the Quality of Life, 2002, Florence, Italy

Abstract

Operations with optoelectronic hidden grid moire patterns to measure the distance from the camera to the object being observed were described in a recent paper. Now, in this paper, the possibility to make 3D metrological teleoperations based on hidden grids moire patterns is discussed.

Citation Download Citation

Pablo F. Meilan, Anibal P. Laquidara, and Mario Garavaglia "Hidden grids, moire patterns, and 3D metrology", Proc. SPIE 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life, (19 November 2003); https://doi.org/10.1117/12.524147

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