Paper
1 February 1985 An Integrated High Speed Photography And Flash X-Ray Instrumentation System For The Evaluation Of Projectile Behaviour In Soft Media
I. B. Macintyre, J. A. Opalko
Author Affiliations +
Proceedings Volume 0491, 16th Intl Congress on High Speed Photography and Photonics; (1985) https://doi.org/10.1117/12.967977
Event: 16th International Congress on High Speed Photography and Photonics, 1984, Strasbourg, France
Abstract
In studying the behaviour of different projectiles when penetrating a target, in this case gelatin, the development of an integrated flash X-ray, high speed photography and ballistic screen instrumentation system has proven useful for gaining qualitative and quantitative data of the projectile motion before, during and after penetration. The system discussed permits a three dimensional analysis of projectile behaviour inside the target, thereby providing measurements of projectile velocity, yaw and tumble, and enabling the study of the cavity formed by the projectile at various instants during penetration. Methodologies are compared and the uncertainties of the measurement techniques are discussed.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
I. B. Macintyre and J. A. Opalko "An Integrated High Speed Photography And Flash X-Ray Instrumentation System For The Evaluation Of Projectile Behaviour In Soft Media", Proc. SPIE 0491, 16th Intl Congress on High Speed Photography and Photonics, (1 February 1985); https://doi.org/10.1117/12.967977
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
X-rays

Head

High speed photography

Radiography

Cameras

Cinematography

Distance measurement

RELATED CONTENT

Evaluation of a gamma camera system for the RITS 6...
Proceedings of SPIE (August 27 2015)
Flash X-Ray Cineradiography At 100,000 Fps
Proceedings of SPIE (March 01 1983)
Nanosecond Two-Dimensional Imaging Using Tomographic Techniques
Proceedings of SPIE (September 01 1987)
Deflection evaluation using time-resolved radiography
Proceedings of SPIE (January 01 1991)
X-ray shadowgraph camera design
Proceedings of SPIE (May 17 1999)

Back to Top