New-style defect inspection system of film

Yan Liang; Wenyao Liu; Ming Liu; Ronggang Lee

doi:10.1117/12.481736

5 September 2002 New-style defect inspection system of film

Yan Liang, Wenyao Liu, Ming Liu, Ronggang Lee

Proceedings Volume 4921, Optical Manufacturing Technologies; (2002) https://doi.org/10.1117/12.481736
Event: Photonics Asia, 2002, Shanghai, China

Abstract

An inspection system has been developed for on-line detection of film defects, which bases on combination of photoelectric imaging and digital image processing. The system runs in high speed of maximum 60m/min. Moving film is illuminated by LED array which emits even infrared (peak wavelength λ_p=940nm), and infrared images are obtained with a high quality and high speed CCD camera. The application software based on Visual C++6.0 under Windows processes images in real time by means of such algorithms as median filter, edge detection and projection, etc. The system is made up of four modules, which are introduced in detail in the paper. On-line experiment results shows that the inspection system can recognize defects precisely in high speed and run reliably in practical application.

Citation Download Citation

Yan Liang, Wenyao Liu, Ming Liu, and Ronggang Lee "New-style defect inspection system of film", Proc. SPIE 4921, Optical Manufacturing Technologies, (5 September 2002); https://doi.org/10.1117/12.481736

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