Paper
27 May 2003 A valuable method for online wire quality control: light scattering from cylindrical rough surfaces
Fernando Perez Quintian, Maria A. Rebollo, Ricardo Gabriel Berlasso, Nestor G. Gaggioli
Author Affiliations +
Proceedings Volume 4933, Speckle Metrology 2003; (2003) https://doi.org/10.1117/12.516661
Event: Speckle Metrology 2003, 2003, Trondheim, Norway
Abstract
In several applications, it is necessary to measure the surface characteristics of a wire so, it is important to do it during the manufacturing process. This work presents two main results: First, an analytical expression for the angular distribution of the mean scattered intensity from cylindrical rough surfaces as a function of the characteristic statistical parameters of the heights. This expression allows to measure the ratio T/σ between the correlation length and the roughness. Second, a quantitative relationship between the size and shape of the speckle grains in the Fraunhofer zone and the statistical properties of the cylindrical rough surface. In the first case, it is shown that the scanning process inherent to usual detection systems can be replaced by single step detection using a screen and a CCD camera. Therefore, this method can be applied to on line wire surface testing where conventional procedures are inadequate. In the second one, the experimental autocorrelation functions at different angles gives another method for measuring the parameter T/σ. Then, the study of the light scattered from cylindrical rough surfaces seem to be of great interest because of its potential application in NDT of manufacturing and finishing processes of components like pipes, junctions, wires and bearings.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fernando Perez Quintian, Maria A. Rebollo, Ricardo Gabriel Berlasso, and Nestor G. Gaggioli "A valuable method for online wire quality control: light scattering from cylindrical rough surfaces", Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); https://doi.org/10.1117/12.516661
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Cited by 2 scholarly publications.
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KEYWORDS
Light scattering

Speckle

Profilometers

Scattering

Statistical analysis

Manufacturing

Speckle pattern

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