Scanning total internal reflection fluorescence microscopy and its applications

James Won Min Chon; Min Gu

doi:10.1117/12.476038

14 November 2002 Scanning total internal reflection fluorescence microscopy and its applications

James Won Min Chon, Min Gu

Proceedings Volume 4937, Biomedical Applications of Micro- and Nanoengineering; (2002) https://doi.org/10.1117/12.476038
Event: SPIE's International Symposium on Smart Materials, Nano-, and Micro- Smart Systems, 2002, Melbourne, Australia

Abstract

In this paper, we explore the multiphoton excitation capabilities of the scanning total internal reflection fluorescence microscopy (STIRFM) using a focused ring-beam illumination and a high numerical-aperture objective (NA = 1.65). The evanescent field produced by the STIRFM is focused laterally, producing a small excitation volume that can effectively induce non-linear optical process. The theoretical simulation of the focal spot produced in STIRFM geometry shows that the focused evanescent field is split into two peaks due to the strong enhancement of longitudinal polarization component at the focus of a high numerical-aperture objective. Experimental images of two-photon excited CdSe quantum dot nanocrystals show the characteristic split focal spot.

Citation Download Citation

James Won Min Chon and Min Gu "Scanning total internal reflection fluorescence microscopy and its applications", Proc. SPIE 4937, Biomedical Applications of Micro- and Nanoengineering, (14 November 2002); https://doi.org/10.1117/12.476038

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