UV-patterned polymide surfaces: characterization by atomic force microscopy (AFM)

Jolanta A. Blach; Gregory S. Watson; Christopher L. Brown; Takeharu Suzuki; Sverre Myhra

doi:10.1117/12.469734

14 November 2002 UV patterned polymide surfaces: Characterization by Atomic Force Microscopy (AFM)

Jolanta A. Blach, Gregory S. Watson, Christopher L. Brown, Takeharu Suzuki, Sverre Myhra

Proceedings Volume 4937, Biomedical Applications of Micro- and Nanoengineering; (2002) https://doi.org/10.1117/12.469734
Event: SPIE's International Symposium on Smart Materials, Nano-, and Micro- Smart Systems, 2002, Melbourne, Australia

Abstract

The bio-activity of polymer surfaces and interfaces depends on surface structure and chemistry, and on the size scale of lateral differentiation. The Atomic Force Microscope (AFM), in its various operational modes, is emerging as an important tool in sub-μm-scale characterization. As-received polyimide surfaces were masked with a TEM grid and irradiated for time periods ranging from 90 to 540 s. Topographical imaging revealed shrinkage of the irradiated regions, presumably arising from loss of species and/or densification. Tip-to-surface adhesion was measured in the Force-vs-distance (F-d) mode. Irradiation was found to cause increased adhesion, arising from increased hydrophilicity and thus greater capillary interaction. Lateral force maps showed that there was an associated increase in friction. This difference is due in part to the additional attractive interaction of the thicker layer of adsorbed moisture, and a contribution from change in surface chemistry. Irradiated surfaces were seeded with live human fibroblasts. One surface was seeded without any additional treatment, whilst another was exposed to poly-L-lysine prior to the seeding. After incubation and growth the surfaces were imaged in PBS (Phosphate Buffered Saline) solution. Growth and strong attachment was evident on both surfaces with no preference to either the irradiated or unirradiated regions.

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Jolanta A. Blach, Gregory S. Watson, Christopher L. Brown, Takeharu Suzuki, and Sverre Myhra "UV patterned polymide surfaces: Characterization by Atomic Force Microscopy (AFM)", Proc. SPIE 4937, Biomedical Applications of Micro- and Nanoengineering, (14 November 2002); https://doi.org/10.1117/12.469734

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KEYWORDS

Chemistry

Silicon

Atomic force microscopy

Capillaries

Adhesives

Polymers

Ultraviolet radiation

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