Paper
17 June 2003 Reliability and commercialization of oxidized VCSEL
Alice Li, Jin-Shan Pan, Horng-Ching Lai, Bor-Lin Lee, Jack Wu, Yung-Sen Lin, Tai-Chan Huo, Calvin Wu, Kai-Feng Huang
Author Affiliations +
Abstract
The reliability of oxidized VCSEL has similar result to implanted VCSEL. This paper presents our work on reliability data of oxidized VCSEL device and also the comparison with implanted VCSEL. The MTTF of oxidized VCSEL is 2.73 x 106 hrs at 55°C, 6 mA and failure rate ~ 1 FITs for the first 2 years operation. The reliability data of oxidized VCSEL includes activation energy, MTTF (mean-time-to failure), failure rate prediction, and 85°C / 85% humidity test will be presented below. Commercialization of oxidized VCSEL is demonstrated such as VCSEL structure, manufacturing facility, and packaging. A cost effective approach is key to its success in applications such as Datacomm.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alice Li, Jin-Shan Pan, Horng-Ching Lai, Bor-Lin Lee, Jack Wu, Yung-Sen Lin, Tai-Chan Huo, Calvin Wu, and Kai-Feng Huang "Reliability and commercialization of oxidized VCSEL", Proc. SPIE 4994, Vertical-Cavity Surface-Emitting Lasers VII, (17 June 2003); https://doi.org/10.1117/12.482636
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KEYWORDS
Vertical cavity surface emitting lasers

Reliability

Picosecond phenomena

Semiconducting wafers

Manufacturing

Failure analysis

Data communications

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