Paper
13 January 2003 Color management with a hammer: the B-spline fitter
Ian E. Bell, Bonny H. P. Liu
Author Affiliations +
Proceedings Volume 5008, Color Imaging VIII: Processing, Hardcopy, and Applications; (2003) https://doi.org/10.1117/12.475435
Event: Electronic Imaging 2003, 2003, Santa Clara, CA, United States
Abstract
To paraphrase Abraham Maslow: If the only tool you have is a hammer, every problem looks like a nail. We have a B-spline fitter customized for 3D color data, and many problems in color management can be solved with this tool. Whereas color devices were once modeled with extensive measurement, look-up tables and trilinear interpolation, recent improvements in hardware have made B-spline models an affordable alternative. Such device characterizations require fewer color measurements than piecewise linear models, and have uses beyond simple interpolation. A B-spline fitter, for example, can act as a filter to remove noise from measurements, leaving a model with guaranteed smoothness. Inversion of the device model can then be carried out consistently and efficiently, as the spline model is well behaved and its derivatives easily computed. Spline-based algorithms also exist for gamut mapping, the composition of maps, and the extrapolation of a gamut. Trilinear interpolation---a degree-one spline---can still be used after nonlinear spline smoothing for high-speed evaluation with robust convergence. Using data from several color devices, this paper examines the use of B-splines as a generic tool for modeling devices and mapping one gamut to another, and concludes with applications to high-dimensional and spectral data.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ian E. Bell and Bonny H. P. Liu "Color management with a hammer: the B-spline fitter", Proc. SPIE 5008, Color Imaging VIII: Processing, Hardcopy, and Applications, (13 January 2003); https://doi.org/10.1117/12.475435
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KEYWORDS
RGB color model

Instrument modeling

Color management

Data modeling

Printing

3D modeling

Measurement devices

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