Paper
16 May 2003 Low-temperature noise measurements on quantum well infrared photodetectors
Beverly J Klemme, Christian C. Morath, Dang T Le
Author Affiliations +
Proceedings Volume 5111, Fluctuations and Noise in Photonics and Quantum Optics; (2003) https://doi.org/10.1117/12.496929
Event: SPIE's First International Symposium on Fluctuations and Noise, 2003, Santa Fe, New Mexico, United States
Abstract
Signal to noise ratio (SNR) is the most important figure of merit for comparing the performance of infrared detectors. When measuring SNR, it is vitally important that all of the noise sources be characterized, including those of the test apparatus. At low temperatures and/or high current, generation-recombination (G-R) noise is expected to be the main noise contributor. At high temperatures and low current, Johnson noise is expected to become comparable to the G-R noise. We present noise measurements under dark conditions on a Quantum Well Infrared Photodetector (QWIP) with careful attention to noise sources present in the measurement apparatus. The noise was dominated by Johnson noise at temperatures <40K, and by G-R noise at 77K and finite bias. A new method to measure noise in QWIPs is described.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Beverly J Klemme, Christian C. Morath, and Dang T Le "Low-temperature noise measurements on quantum well infrared photodetectors", Proc. SPIE 5111, Fluctuations and Noise in Photonics and Quantum Optics, (16 May 2003); https://doi.org/10.1117/12.496929
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Cited by 5 scholarly publications.
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KEYWORDS
Quantum well infrared photodetectors

Resistors

Resistance

Sensors

Field effect transistors

Signal to noise ratio

Capacitance

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