Paper
22 September 2003 Interferometric dimension comparator
Olga Iwasinska, Marek Dobosz
Author Affiliations +
Proceedings Volume 5124, Optoelectronic and Electronic Sensors V; (2003) https://doi.org/10.1117/12.517122
Event: Optoelectronic and Electronic Sensors V, 2002, Rzeszow, Poland
Abstract
A new touchless interference method of length measurement is presented. A central interference fringe of polychromatic light is used to determine a reference distance. The method is based on comparison of two elements i.e. gauge blocks with one of them serving as a reference. The displacement of an interferometer reflector between the reference points related to the reference block and a measured gauge block is determined. The measurement of displacement and the detection of the gauge block positions were carried out within one optical axis. The presented measuring system is especially predestined as an extension to commercially available interferometers, making possible their application for a calibration procedure of gauge blocks.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Olga Iwasinska and Marek Dobosz "Interferometric dimension comparator", Proc. SPIE 5124, Optoelectronic and Electronic Sensors V, (22 September 2003); https://doi.org/10.1117/12.517122
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Cited by 1 scholarly publication.
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KEYWORDS
Interferometers

Beam splitters

Reflectors

Calibration

Semiconductor lasers

Mirrors

Distance measurement

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