Revisiting the Hartmann test

Benjamin A. Wells; John Myrick

doi:10.1117/12.514264

22 December 2003 Revisiting the Hartmann test

Benjamin A. Wells, John Myrick

Proceedings Volume 5180, Optical Manufacturing and Testing V; (2003) https://doi.org/10.1117/12.514264
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

We have implemented a variation of the classical Hartmann test on a commercial lens bench. We use a single motorized aperture for scanning in X,Y, an image analysis microscope with CCD detector, and image processing software. In a short time, it is possible to measure and plot the wavefront tilt at hundreds of points across the entrance pupil. The technique combines both high sensitivity and large dynamic range. For example, is possible to measure wavefront tilt to 1/200 wave across a 1.5 mm sampling aperture. The high dynamic range allows useful measurement of poorly molded plastic lenses whose surface figure would not yield useable fringes on an interferometer.

Citation Download Citation

Benjamin A. Wells and John Myrick "Revisiting the Hartmann test", Proc. SPIE 5180, Optical Manufacturing and Testing V, (22 December 2003); https://doi.org/10.1117/12.514264

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