Analysis and representation of BSDF and BRDF measurements

Michael E. Thomas; David W. Blodgett; Daniel V. Hahn

doi:10.1117/12.508560

14 November 2003 Analysis and representation of BSDF and BRDF measurements

Michael E. Thomas, David W. Blodgett, Daniel V. Hahn

Proceedings Volume 5192, Optical Diagnostic Methods for Inorganic Materials III; (2003) https://doi.org/10.1117/12.508560
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

BSDF and BRDF measurements of randomly rough surfaces are often limited to the plane of incidence. For a surface with no change in optical properties upon rotation in the plane of the sample, this is sufficient to completely represent the BRDF or BSDF of a material at a specific frequency. We apply a simple empirical model that accurately represents the full bi-directional dependence of the scatterance or reflectance based on this limited experimental data set. From these models the total integrated reflectance, total integrated scatterance, and emittance can be obtained. Example measurements of opaque painted flat surfaces, transparent samples, and fibers are presented.

Citation Download Citation

Michael E. Thomas, David W. Blodgett, and Daniel V. Hahn "Analysis and representation of BSDF and BRDF measurements", Proc. SPIE 5192, Optical Diagnostic Methods for Inorganic Materials III, (14 November 2003); https://doi.org/10.1117/12.508560

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