Paper
10 June 2004 High-precision x-ray diagnostics of laser-produced plasmas
Oldrich Renner, Eckhart Foerster, Ingo Uschmann, Klaus Eidmann
Author Affiliations +
Abstract
Diagnostic information obtained from x-ray emission accompanying the laser-matter interaction represents a primary tool for identification and exploitation of phenomena occurring in hot dense plasmas. To fully utilize the potential contained in the shapes and shifts of the spectral lines, sophisticated high-resolution instruments have been developed. The basic spectroscopic conceptions for K-shell plasma diagnosis are outlined. The main characteristics of toroidally bent crystal spectrometers and vertical-dispersion instruments are briefly reviewed. The applications of high-precision x-ray spectrometers in investigation of strongly correlated plasmas are demonstrated on a detailed analysis of the spectral line emission from two types of laser-produced plasmas. The redults of experiments performed at 0.4 ns laser system ASTERIX and 150 fs system ATLAS are presented, the diverse character of the observed line profiles and the dense-plasma line shifts to red is discussed. The conclusions for the line shift-based plasma diagnosis are drawn.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Oldrich Renner, Eckhart Foerster, Ingo Uschmann, and Klaus Eidmann "High-precision x-ray diagnostics of laser-produced plasmas", Proc. SPIE 5482, Laser Optics 2003: Superintense Light Fields and Ultrafast Processes, (10 June 2004); https://doi.org/10.1117/12.558575
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Cited by 1 scholarly publication.
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KEYWORDS
Plasmas

Crystals

Aluminum

Spectrometers

Sensors

Diagnostics

Stereolithography

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