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High resolution X-ray spectroscopy of optically thin sources is discussed. Based on a brief description of the general properties of highly ionized, optically thin sources and their spectra, and a set of specific examples drawn from the recent literature, I outline arguments for the importance of routine spectroscopy of faint sources as a science driver for future missions.
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Frits B. S. Paerels, "High-resolution x-ray spectroscopy of optically-thin sources," Proc. SPIE 5488, UV and Gamma-Ray Space Telescope Systems, (11 October 2004); https://doi.org/10.1117/12.561499