Paper
6 May 1985 Survey Of The Collective French Effort On X-Ray Multi Layered Optics
P. Dhez
Author Affiliations +
Abstract
In this overview we emphasise the present effort on multilayers studies in France. Several French laboratories have coordinated a research program in view to develop the different technologies now used to prepare multilayered optics.This program takes into account the needs to overcome the constraints of the grazing incidence X-UV optics for the synchrotron source users, plasmas physicists and astrophysicists.
© (1985) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Dhez "Survey Of The Collective French Effort On X-Ray Multi Layered Optics", Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); https://doi.org/10.1117/12.949658
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Cited by 2 scholarly publications.
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KEYWORDS
Reflectivity

Reflectometry

X-ray optics

Synchrotrons

Grazing incidence

Multilayers

X-rays

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