Paper
20 January 2005 Wavelength-shifting interferometry by a wide tunable laser source with a new phase-shifting technique
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Abstract
A wavelength-shifting interferometer has been constructed by using a wide-tunable Ti:sapphire laser for three-dimensional range measurement. The phase shifts in five steps by wavelength changes can be measured with an Schwider-Hariharan algorithm in conjunction with sub-fringe measurements by PZT movements in four steps. Experimental results for a step object have been shown.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Masato Higashi, Takeshi Takahashi, Ribun Onodera, and Yukihiro Ishii "Wavelength-shifting interferometry by a wide tunable laser source with a new phase-shifting technique", Proc. SPIE 5633, Advanced Materials and Devices for Sensing and Imaging II, (20 January 2005); https://doi.org/10.1117/12.580464
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KEYWORDS
Phase shifts

Interferometers

Sapphire lasers

Ferroelectric materials

Phase measurement

Interferometry

Light sources

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