Paper
8 December 2004 Mesostructure of Fe-based ribbon influenced by inner stress
Yun Zhang Fang, W. H. Wu, J. J. Zheng, F. M. Wu, G. J. Lin, Y. K. Wang, J. W. Pan
Author Affiliations +
Proceedings Volume 5774, Fifth International Conference on Thin Film Physics and Applications; (2004) https://doi.org/10.1117/12.607369
Event: Fifth International Conference on Thin Film Physics and Applications, 2004, Shanghai, China
Abstract
The mesostructure of Fe-based (Fe73.5Cu1Nb3Si13.5B9)nanocrystalline ribbon was observed by investigation of the section samples and the molted samples with atomic force microscopy (AFM). The section of the Fe-based crystalline ribbon can be divided into five areas. An apparent mesostructural difference was found in the different areas of the ribbon crystallized after annealing. In RFA, the coarse grains gathering in longitudinal arrangement, while in FFA the fine grains gathering arranged transversely dominates. The size of crystalline grain increases from about 10 nm to about 300 nm with the area gradating from the free surface to the rolled surface. The main reason for such mesostructural difference could be due to the different residual inner stress in the different areas of the amorphous ribbon.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yun Zhang Fang, W. H. Wu, J. J. Zheng, F. M. Wu, G. J. Lin, Y. K. Wang, and J. W. Pan "Mesostructure of Fe-based ribbon influenced by inner stress", Proc. SPIE 5774, Fifth International Conference on Thin Film Physics and Applications, (8 December 2004); https://doi.org/10.1117/12.607369
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KEYWORDS
Crystals

Atomic force microscopy

Radiofrequency ablation

Fermium

Frequency modulation

Annealing

Copper

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